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X-ray Diffraction Study of MgB2 at Low Temperatures

Authors :
Xue, Y.
Asada, S.
Hosomichi, A.
Naher, S.
Xue, J.
Kaneko, H.
Suzuki, H.
Muranaka, T.
Akimitsu, J.
Source :
Journal of Low Temperature Physics; March 2005, Vol. 138 Issue: 5-6 p1105-1115, 11p
Publication Year :
2005

Abstract

Abstract We have performed powder X-ray diffraction of MgB2 superconductor between 10 and 300 K. Temperature dependence of integrated intensities of both (002) and (110) X-ray reflections shows a peak at around TC, superconducting transition temperature. The integrated intensity of the X-ray reflection is related to the phonon frequency through a Debye--Waller factor. Lattice parameters a and c show negative thermal expansions at low temperatures. The negative thermal expansion might be due to an electronic origin and not directly related to the superconducting transition.

Details

Language :
English
ISSN :
00222291 and 15737357
Volume :
138
Issue :
5-6
Database :
Supplemental Index
Journal :
Journal of Low Temperature Physics
Publication Type :
Periodical
Accession number :
ejs7012333
Full Text :
https://doi.org/10.1007/s10909-004-2903-2