Back to Search
Start Over
X-ray Diffraction Study of MgB2 at Low Temperatures
- Source :
- Journal of Low Temperature Physics; March 2005, Vol. 138 Issue: 5-6 p1105-1115, 11p
- Publication Year :
- 2005
-
Abstract
- Abstract We have performed powder X-ray diffraction of MgB2 superconductor between 10 and 300 K. Temperature dependence of integrated intensities of both (002) and (110) X-ray reflections shows a peak at around TC, superconducting transition temperature. The integrated intensity of the X-ray reflection is related to the phonon frequency through a Debye--Waller factor. Lattice parameters a and c show negative thermal expansions at low temperatures. The negative thermal expansion might be due to an electronic origin and not directly related to the superconducting transition.
Details
- Language :
- English
- ISSN :
- 00222291 and 15737357
- Volume :
- 138
- Issue :
- 5-6
- Database :
- Supplemental Index
- Journal :
- Journal of Low Temperature Physics
- Publication Type :
- Periodical
- Accession number :
- ejs7012333
- Full Text :
- https://doi.org/10.1007/s10909-004-2903-2