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FLM PL-VIO: A Robust Monocular Point-Line Visual-Inertial Odometry Based on Fast Line Matching

Authors :
Lin, Shuyue
Zhang, Xuetao
Liu, Yisha
Wang, Hanzhang
Zhang, Xuebo
Zhuang, Yan
Source :
IEEE Transactions on Industrial Electronics; December 2024, Vol. 71 Issue: 12 p16026-16036, 11p
Publication Year :
2024

Abstract

This article proposes a monocular point-line visual-inertial odometry (VIO) with line filtering and fast line matching (FLM PL-VIO), improving the localization accuracy and robustness. Different from the existing point-line VIO frameworks, we construct a new line filter to make the line features uniformly distributed, providing better spatial geometric constraints. In addition, we propose a fast line matching method based on the multisegment tracking and extended verification, which can solve the line matching failure caused by the fragmentation of line detection and object occlusion. As a result, it guarantees the accuracy of line matching while significantly improving the matching speed. The state estimator is constructed by jointly optimizing visual residuals from the point and line features, inertial residuals, and prior information of marginalization. Our system is evaluated on the challenging datasets and the real-world flight experiment, demonstrating superior performance in the localization accuracy, the time of line detection and matching compared with the state-of-the-art localization algorithms.

Details

Language :
English
ISSN :
02780046 and 15579948
Volume :
71
Issue :
12
Database :
Supplemental Index
Journal :
IEEE Transactions on Industrial Electronics
Publication Type :
Periodical
Accession number :
ejs67731105
Full Text :
https://doi.org/10.1109/TIE.2024.3379661