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A comprehensive survey of detecting deepfakes techniques

Authors :
Maske, Dheeraj
Munot, Satyam
Mugut, Aman
Mundada, Girish
Source :
AIP Conference Proceedings Online; October 2024, Vol. 3156 Issue: 1 p030012-30019, 8p
Publication Year :
2024

Details

Language :
English
ISSN :
0094243X and 15517616
Volume :
3156
Issue :
1
Database :
Supplemental Index
Journal :
AIP Conference Proceedings Online
Publication Type :
Periodical
Accession number :
ejs67656126
Full Text :
https://doi.org/10.1063/5.0228224