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Current Kink Effect in β-Ga₂O₃ MOSFETs Induced by Incomplete Ionization of Donors

Authors :
Yu, Xinxin
Gong, Hehe
Zhou, Jianjun
Shen, Zhenghao
Ren, Fangfang
Chen, Dunjun
Ou, Xin
Gu, Shulin
Kong, Yuechan
Li, Zhonghui
Chen, Tangsheng
Zhang, Rong
Zheng, Youdou
Ye, Jiandong
Source :
IEEE Transactions on Electron Devices; October 2024, Vol. 71 Issue: 10 p5908-5913, 6p
Publication Year :
2024

Abstract

In this article, the origin of severe drain–source current kink effect in <inline-formula> <tex-math notation="LaTeX">$\beta $ </tex-math></inline-formula>-Ga<subscript>2</subscript>O<subscript>3</subscript> MOSFETs has been exploited by means of temperature- and pulse-dependent current–voltage (I–V) analysis. By reducing the pulse biasing widths, whereby the self-heating effect was negligible, the output characteristics were free of kink but with a rather low drain–source current density (<inline-formula> <tex-math notation="LaTeX">${I}_{\text {DS}}$ </tex-math></inline-formula>) at a high drain voltage (<inline-formula> <tex-math notation="LaTeX">${V}_{\text {DS}}$ </tex-math></inline-formula>) of 30 V. The current kink effect started to occur with a direct-current power consumption of approximately 850 mW/mm. The elimination of kink features was also observed together with a large <inline-formula> <tex-math notation="LaTeX">${I}_{\text {DS}}$ </tex-math></inline-formula> at elevated temperatures over 100 °C. These observations indicate that the kink effect is strongly related to thermal activation of incomplete ionized donors by either the self-heating effect or external intentional heating stress rather than high electric field. In terms of temperature-dependent current output characteristics, the thermal activation energy is determined to be 136 meV, which is consistent with the reported unintentional donors with a high activation energy of 110 meV. It implies that additional electrons are thermally activated and emitted from the incomplete ionized donors in <inline-formula> <tex-math notation="LaTeX">$\beta $ </tex-math></inline-formula>-Ga<subscript>2</subscript>O<subscript>3</subscript> channel or buffer layers through the self-heating effect, contributing to the channel conductivity modulation and the consequent current kink effect. These findings may bridge the knowledge gap between charge transport mechanisms and the reliability degradation of <inline-formula> <tex-math notation="LaTeX">$\beta $ </tex-math></inline-formula>-Ga<subscript>2</subscript>O<subscript>3</subscript> power switches.

Details

Language :
English
ISSN :
00189383 and 15579646
Volume :
71
Issue :
10
Database :
Supplemental Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Periodical
Accession number :
ejs67507597
Full Text :
https://doi.org/10.1109/TED.2024.3440950