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Demonstrating sub-electron noise performance in single electron sensitive readout (SiSeRO) devices
- Source :
- Proceedings of SPIE; August 2024, Vol. 13103 Issue: 1 p1310312-1310312-9
- Publication Year :
- 2024
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 13103
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Periodical
- Accession number :
- ejs67441741
- Full Text :
- https://doi.org/10.1117/12.3020855