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Development of a 1-MV Field-Emission Electron Microscope III. Electron Optical Design and Development of Field-Emission Electron Gun

Authors :
Yoshida, Takaho
Kawasaki, Takeshi
Endo, Junji
Furutsu, Tadao
Matsui, Isao
Matsuda, Tsuyoshi
Osakabe, Nobuyuki
Tonomura, Akira
Kitazawa, Koichi
Source :
Microscopy and Microanalysis; August 2000, Vol. 6 Issue: 1, Number 1 Supplement 2 p1142-1143, 2p
Publication Year :
2000

Abstract

Bright and coherent electron beams have been opening new frontiers in science and technology. So far, we have developed several field-emission transmission electron microscopes (FE-TEM) with increasing accelerating voltages to provide higher beam brightness. By using a 200-kV FE-TEM and electron holography techniques, we directly confirmed the Aharonov-Bohm effect. A 350-kV FE-TEM equipped with a low-temperature specimen stage enabled us to observe moving vortices in superconductors.2 Most Recently, we have developed a new 1-MV FE-TEM with a newly designed FE gun to obtain an even brighter and more coherent electron beam.Electron beam brightness, Br,defined in Figure 1,is suitable for measuring the performance of electron guns, since both lens aberrations and mechanical/electrical vibrations contribute to a decrease in beam brightness, and beam coherency is proportional to (Br)1/2.Therefore, we optimized design of the illuminating system and its operation by maximizing the electron beam brightness.

Details

Language :
English
ISSN :
14319276 and 14358115
Volume :
6
Issue :
1, Number 1 Supplement 2
Database :
Supplemental Index
Journal :
Microscopy and Microanalysis
Publication Type :
Periodical
Accession number :
ejs67355270
Full Text :
https://doi.org/10.1017/S1431927600038204