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Thermal vacuum testing of the compact cryocooler control electronics (C3E) with a Lockheed Martin microcryocooler

Authors :
Fulop, Gabor F.
MacDougal, Michael H.
Ting, David Z.
Kimata, Masafumi
Kirkconnell, C. S.
Baxter, J. M.
Hon, R. C.
Smith, C. K.
Huynh, L.
Gregoire, J. F.
Kaszeta, R. W.
Olson, J. R.
Roth, E.
Source :
Proceedings of SPIE; June 2024, Vol. 13046 Issue: 1 p130461N-130461N-9, 1174159p
Publication Year :
2024

Details

Language :
English
ISSN :
0277786X
Volume :
13046
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs67190925
Full Text :
https://doi.org/10.1117/12.3015951