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Reliable post-production characterization approach to TiO2/SiO2electron-beam optical coatings based on multi-sample photometric and ellipsometric data
- Source :
- Proceedings of SPIE; June 2024, Vol. 13020 Issue: 1 p130200S-130200S-8, 1171809p
- Publication Year :
- 2024
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 13020
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Periodical
- Accession number :
- ejs66982639
- Full Text :
- https://doi.org/10.1117/12.3017184