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All-Solution-Processed Electronics with Sub-Microscale Resolution and Nanoscale Fidelity Fabricated Via a Humidity-Controlled, Surface Energy-Directed Assembly Process

Authors :
Zhang, Jingwei
Wang, Guangji
Chai, Zhimin
Li, Zetong
Yuan, Siqing
Wang, Yihuan
Ding, Yi
Sun, Taohan
Wang, Tongqing
Zhao, Dewen
Busnaina, Ahmed A.
Ren, Tian-Ling
Lu, Xinchun
Source :
ACS Nano; August 2024, Vol. 18 Issue: 31 p20493-20503, 11p
Publication Year :
2024

Abstract

Solution-based processes have received considerable attention in the fabrication of electronics and sensors owing to their merits of being low-cost, vacuum-free, and simple in equipment. However, the current solution-based processes either lack patterning capability or have low resolution (tens of micrometers) and low pattern fidelity in terms of line edge roughness (LER, several micrometers). Here, we present a surface energy-directed assembly (SEDA) process to fabricate metal oxide patterns with up to 2 orders of magnitude improvement in resolution (800 nm) and LER (16 nm). Experiment results show that high pattern fidelity can be achieved only at low relative humidities of below 30%. The reason for this phenomenon lies in negligible water condensation on the solution droplet. Employing the SEDA process, all-solution-processed metal oxide thin film transistors (TFTs) are fabricated by using indium oxide as channel layers, indium tin oxide as source/drain electrodes and gate electrodes, and aluminum oxide as gate dielectrics. TFT-based logic gate circuits, including NOT, NOR, NAND, and AND are fabricated as well, demonstrating the applicability of the SEDA process in fabricating large area functional electronics.

Details

Language :
English
ISSN :
19360851 and 1936086X
Volume :
18
Issue :
31
Database :
Supplemental Index
Journal :
ACS Nano
Publication Type :
Periodical
Accession number :
ejs66903586
Full Text :
https://doi.org/10.1021/acsnano.4c04936