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Manipulating and investigating the room-temperature magnetic memory phenomenon: The impact of rare-earth ion doping on nickel oxide nanoparticles

Authors :
Chiu, Hsin-Hao
Ho, Ming-Kang
Hsu, Tsu-En
Yu, Shih-Lung
Manjunatha, K.
Cheng, Chia-Liang
Li, Tai-Yue
Chang, Chung-Kai
Tummala, Srikrishna
Ho, Yen-Peng
Angadi V, Jagadeesha
Matteppanavar, Shidaling
Gandhi, Ashish Chhaganlal
Wu, Sheng Yun
Source :
Materials Today Chemistry; July 2024, Vol. 39 Issue: 1
Publication Year :
2024

Abstract

This study investigates the relationship between point defect density and magnetic properties in nickel oxide (NiO) nanoparticles (NPs). Specifically, we explore the effects of 0.5 % trivalent rare-earth ion (RE3+: Ce3+, Pr3+, Nd3+, Sm3+, and Dy3+) doping on NiO NPs, considering the influence of RE3+ionic radius on structural modulation and magnetic properties. Our findings reveal important trends: increased microstrain (0.08 %–0.17 %) and decreased crystalline size (36–17 nm) with increasing ionic radius (r = 0.91 to 1.01 Å), along with a preference for growth along the (1 1 1) plane over (2 0 0). Additionally, multivalent point defects increase with the increase of ionic radius. Substituting Ni2+site with RE3+ion promotes nearest-neighbor weak ferromagnetic interaction over next-nearest-neighbor strong antiferromagnetic (AF) interaction. This leads to a redshift of two magnons (2 M) frequency by 50 cm−1and enhanced room temperature (RT) magnetization (0.23–0.43 emu/g) with increasing ionic radius. Ce-doped NiO (r = 1.01 Å) shows the smallest crystalline size (17 nm), maximum 2 M redshift, and enhanced RT magnetization (0.43 emu/g) based on interacting bound magnetic polaron model. Ce-, Pr-, Nd-, and Sm-doped NiO NPs exhibit RT magnetic memory effects, while Dy-doped NiO NPs (r = 0.912 Å) display AF properties. Our analysis provides valuable insights for designing RT magnetic memory materials with tailored properties through suitable RE3+ion substitutions.

Details

Language :
English
ISSN :
24685194
Volume :
39
Issue :
1
Database :
Supplemental Index
Journal :
Materials Today Chemistry
Publication Type :
Periodical
Accession number :
ejs66883699
Full Text :
https://doi.org/10.1016/j.mtchem.2024.102190