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P‐11.14: The Impact of Defects on the Performance of Micro‐LED Devices: A Simulation Study

Authors :
Ye, Jinyu
Zhou, Xiongtu
Zhang, Yongai
Wu, Chaoxing
Guo, Tailiang
Yan, Qun
Source :
SID Symposium Digest of Technical Papers; April 2024, Vol. 55 Issue: Supplement 1 p1332-1334, 3p
Publication Year :
2024

Abstract

In order to evaluate the influence of defects on the performance of Micro‐LED devices, this paper adopts a finite element simulation method based on semiconductor physics. Firstly, a simulation model of Micro‐LED devices is established, including key components such as electrodes, materials, and structures. Then, defect parameters are set to simulate the optical properties of Micro‐LED devices. Finally, by comparing the simulation results with or without introducing deep level defects, the influence law of these defects on the optical output and electrical characteristics of Micro‐LED devices was revealed.

Details

Language :
English
ISSN :
0097966X
Volume :
55
Issue :
Supplement 1
Database :
Supplemental Index
Journal :
SID Symposium Digest of Technical Papers
Publication Type :
Periodical
Accession number :
ejs66743907
Full Text :
https://doi.org/10.1002/sdtp.17356