TEM-compatible microdevice for the complete thermoelectric characterization of epitaxially integrated Si-based nanowiresElectronic supplementary information (ESI) available: Additional referenced figures and tables as well as details of the calibration process. See DOI: https://doi.org/10.1039/d4nh00114a

MLA

Sojo-Gordillo, Jose M., et al. “TEM-Compatible Microdevice for the Complete Thermoelectric Characterization of Epitaxially Integrated Si-Based NanowiresElectronic Supplementary Information (ESI) Available: Additional Referenced Figures and Tables as Well as Details of the Calibration Process. See DOI: Https://Doi.Org/10.1039/D4nh00114a.” Nanoscale Horizons, vol. 9, no. 7, Jan. 2024, pp. 1200–10. EBSCOhost, https://doi.org/10.1039/d4nh00114a.

APA

Sojo-Gordillo, J. M., Kaur, Y., Tachikawa, S., Alayo, N., Salleras, M., Forrer, N., Fonseca, L., Morata, A., Tarancón, A., & Zardo, I. (2024). TEM-compatible microdevice for the complete thermoelectric characterization of epitaxially integrated Si-based nanowiresElectronic supplementary information (ESI) available: Additional referenced figures and tables as well as details of the calibration process. See DOI: https://doi.org/10.1039/d4nh00114a. Nanoscale Horizons, 9(7), 1200–1210. https://doi.org/10.1039/d4nh00114a

Chicago

Sojo-Gordillo, Jose M., Yashpreet Kaur, Saeko Tachikawa, Nerea Alayo, Marc Salleras, Nicolas Forrer, Luis Fonseca, Alex Morata, Albert Tarancón, and Ilaria Zardo. 2024. “TEM-Compatible Microdevice for the Complete Thermoelectric Characterization of Epitaxially Integrated Si-Based NanowiresElectronic Supplementary Information (ESI) Available: Additional Referenced Figures and Tables as Well as Details of the Calibration Process. See DOI: Https://Doi.Org/10.1039/D4nh00114a.” Nanoscale Horizons 9 (7): 1200–1210. doi:10.1039/d4nh00114a.