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Electron-phonon coupling and transient dynamics of hot carriers: from interpretation of photoemission experiments to transport simulations in devices

Authors :
Haacke, Stefan
Ghanem, M.
Dollfus, P.
Saint-Martin, J.
Sen, R.
Vast, N.
Sjakste, J.
Source :
Proceedings of SPIE; June 2024, Vol. 12992 Issue: 1 p1299207-1299207-7
Publication Year :
2024

Details

Language :
English
ISSN :
0277786X
Volume :
12992
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs66686615
Full Text :
https://doi.org/10.1117/12.3022114