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EUV lithography patterning using multi-trigger resist

Authors :
Guerrero, Douglas
Amblard, Gilles R.
Popescu, C.
O'Callaghan, G.
McClelland, A.
Storey, C.
Roth, J.
Jackson, E.
Robinson, A. P. G.
Source :
Proceedings of SPIE; April 2024, Vol. 12957 Issue: 1 p129570R-129570R-8, 1166139p
Publication Year :
2024

Details

Language :
English
ISSN :
0277786X
Volume :
12957
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs66210824
Full Text :
https://doi.org/10.1117/12.3010963