Back to Search Start Over

Affordable optical proximity correction runtime for EUV curvilinear mask tape-out flow

Details

Language :
English
ISSN :
0277786X
Volume :
12954
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs66202424
Full Text :
https://doi.org/10.1117/12.3009981