Comprehensive Investigation of Shelf Life and Performance of Flexible Hybrid RRAM Devices With PVK:MoS2/TiO2 Bilayer

MLA

Saini, Shalu, et al. “Comprehensive Investigation of Shelf Life and Performance of Flexible Hybrid RRAM Devices With PVK:MoS2/TiO2 Bilayer.” IEEE Transactions on Electron Devices, vol. 71, no. 5, Jan. 2024, pp. 2983–89. EBSCOhost, https://doi.org/10.1109/TED.2024.3383408.

APA

Saini, S., Lodhi, A., Dwivedi, A., Khandelwal, A., & Tiwari, S. P. (2024). Comprehensive Investigation of Shelf Life and Performance of Flexible Hybrid RRAM Devices With PVK:MoS2/TiO2 Bilayer. IEEE Transactions on Electron Devices, 71(5), 2983–2989. https://doi.org/10.1109/TED.2024.3383408

Chicago

Saini, Shalu, Anil Lodhi, Anurag Dwivedi, Arpit Khandelwal, and Shree Prakash Tiwari. 2024. “Comprehensive Investigation of Shelf Life and Performance of Flexible Hybrid RRAM Devices With PVK:MoS2/TiO2 Bilayer.” IEEE Transactions on Electron Devices 71 (5): 2983–89. doi:10.1109/TED.2024.3383408.