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IC Reliability and Test: What Will Deep Submicron Bring?
- Source :
- IEEE Design & Test of Computers; 1999, Vol. 16 Issue: 2 p84-91, 8p
- Publication Year :
- 1999
Details
- Language :
- English
- ISSN :
- 07407475 and 15581918
- Volume :
- 16
- Issue :
- 2
- Database :
- Supplemental Index
- Journal :
- IEEE Design & Test of Computers
- Publication Type :
- Periodical
- Accession number :
- ejs66114601
- Full Text :
- https://doi.org/10.1109/MDT.1999.765207