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Automatic grain trait measurement via concave point detection and ellipse fitting

Authors :
Lin, Jerry Chun-Wei
Shao, Haidong
Jiang, Zhonghua
Xiong, Binbin
Ma, Yan
Huang, Hexiao
Source :
Proceedings of SPIE; April 2024, Vol. 13090 Issue: 1 p130901O-130901O-9, 1178119p
Publication Year :
2024

Details

Language :
English
ISSN :
0277786X
Volume :
13090
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs66077005
Full Text :
https://doi.org/10.1117/12.3026419