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Machine Learning for EMC/SI/PI – Blackbox, Physics Recovery, and Decision Making
- Source :
- IEEE Electromagnetic Compatibility Magazine; 2023, Vol. 12 Issue: 4 p65-75, 11p
- Publication Year :
- 2023
-
Abstract
- Machine learning (ML) is one of today's most studied subjects in almost every research area. It provides interesting mathematical tools that could inspire us to rethink about the EMC/SI/PI engineering. This paper gives a preliminary review on machine learning methods for EMC/SI/PI technology developments. Sample examples from publications on EMC/SI/PI methodologies powered by machine learning methods are discussed. There are three major types of machine learning methods. From an EMC/SI/PI engineering point of view, supervised learning provides heterogeneous high dimensional surrogate blackbox model, unsupervised learning enables dimension reduction for physics recovery, and reinforcement learning uses rule-based decision making for optimizations. It is important to select proper machine learning tools and algorithms for various EMC/SI/PI tasks.
Details
- Language :
- English
- ISSN :
- 21622264 and 21622272
- Volume :
- 12
- Issue :
- 4
- Database :
- Supplemental Index
- Journal :
- IEEE Electromagnetic Compatibility Magazine
- Publication Type :
- Periodical
- Accession number :
- ejs65828136
- Full Text :
- https://doi.org/10.1109/MEMC.2023.10466473