Two-Dimensional Visible Synchrotron Radiation Interferometry for Measuring Transverse Beam-Profile at HLS-II

Accurate measurement of the transverse beam-profile is critical to analyzing the performance of the electron storage ring light sources. In this paper, a two-dimensional interferometer using the spatial coherence of the synchrotron radiation is developed to measure the transverse beam-profile of Hefei Light Source-II (HLS-II). On the B7 beamline, the transverse beam-profile of this light source point was measured by the interference fringes of Synchrotron Radiation (SR) with wavelength of 500 nm. Under the normal top-off operation mode of HLS-II, the horizontal and vertical beam sizes measured by the interferometer are <tex>$291.9\pm 1.6\ \mu\mathrm{m}$</tex> and <tex>$241.3\pm 0.9\ \mu\mathrm{m}$</tex>, respectively. At the same time, the effect of beam intensity on the transverse beam-profile was also investigated. The interferometer measurement system we designed satisfies the real-time online monitoring of the transverse beam-profile in the top-off operation mode of HLS-II.