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EDFA-enabled resonance beam charging at 1550 nm for improved efficiency, safety, and performance

Authors :
Liu, Jun
Jiang, Shibin
Hartl, Ingmar
Javed, Nadeem
Nguyen, Ngoc-Luu
Ali Naqvi, Syed Farhan
Ha, Jinyong
Source :
Proceedings of SPIE; November 2023, Vol. 12760 Issue: 1 p127601D-127601D-5, 1148415p
Publication Year :
2023

Details

Language :
English
ISSN :
0277786X
Volume :
12760
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs64715862
Full Text :
https://doi.org/10.1117/12.2689234