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Improvements in the measurement of local critical dimension uniformity for holes and pillars

Authors :
Naulleau, Patrick P.
Gargini, Paolo A.
Itani, Toshiro
Ronse, Kurt G.
Mack, Chris A.
Delvaux, Christie
De Simone, Danilo
Lorusso, Gian
Source :
Proceedings of SPIE; November 2023, Vol. 12750 Issue: 1 p127500G-127500G-8, 1147509p
Publication Year :
2023

Details

Language :
English
ISSN :
0277786X
Volume :
12750
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs64715805
Full Text :
https://doi.org/10.1117/12.2688355