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Design and Characterization of a <4-mW/Qubit 28-nm Cryo-CMOS Integrated Circuit for Full Control of a Superconducting Quantum Processor Unit Cell

Authors :
Yoo, Juhwan
Chen, Zijun
Arute, Frank
Montazeri, Shirin
Szalay, Marco
Erickson, Catherine
Jeffrey, Evan
Fatemi, Reza
Giustina, Marissa
Ansmann, Markus
Lucero, Erik
Kelly, Julian
Bardin, Joseph C.
Source :
IEEE Journal of Solid-State Circuits; November 2023, Vol. 58 Issue: 11 p3044-3059, 16p
Publication Year :
2023

Abstract

A universal fault-tolerant quantum computer will require large-scale control systems that can realize all the waveforms required to implement a gateset that is universal for quantum computing. Optimization of such a system, which must be precise and extensible, is an open research challenge. Here, we present a cryogenic quantum control integrated circuit (IC) that is able to control all the necessary degrees of freedom of a two-qubit subcircuit of a superconducting quantum processor. Specifically, the IC contains a pair of 4–8-GHz RF pulse generators for &lt;inline-formula&gt; &lt;tex-math notation=&quot;LaTeX&quot;&gt;$XY$ &lt;/tex-math&gt;&lt;/inline-formula&gt; control, three baseband current generators for qubit and coupler frequency control, and a digital controller that includes a sequencer for gate sequence playback. After motivating the architecture, we describe the circuit-level implementation details and present experimental results. Using standard benchmarking techniques, we show that the cryogenic CMOS (cryo-CMOS) IC is able to execute the components of a gateset that is universal for quantum computing while achieving single-qubit &lt;inline-formula&gt; &lt;tex-math notation=&quot;LaTeX&quot;&gt;$XY$ &lt;/tex-math&gt;&lt;/inline-formula&gt; and &lt;inline-formula&gt; &lt;tex-math notation=&quot;LaTeX&quot;&gt;$Z$ &lt;/tex-math&gt;&lt;/inline-formula&gt; average gate error rates of 0.17%–0.36% and 0.14%–0.17%, respectively, as well as two-qubit average cross-entropy benchmarking (XEB) cycle error rates of 1.2%. These error rates, which were achieved while dissipating just 4 mW/qubit, are comparable to the measured error rates obtained using baseline room-temperature electronics.

Details

Language :
English
ISSN :
00189200 and 1558173X
Volume :
58
Issue :
11
Database :
Supplemental Index
Journal :
IEEE Journal of Solid-State Circuits
Publication Type :
Periodical
Accession number :
ejs64344965
Full Text :
https://doi.org/10.1109/JSSC.2023.3309317