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3D SEM metrology of microstructures for high volume manufacturing

Authors :
Behringer, Uwe F.
Loeschner, Hans
Finders, Jo
Abdallah, Zeinab
Fay, Aurélien
Bonnet, Stéphane
Source :
Proceedings of SPIE; October 2023, Vol. 12802 Issue: 1 p128020N-128020N-20, 12674001p
Publication Year :
2023

Details

Language :
English
ISSN :
0277786X
Volume :
12802
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs64146577
Full Text :
https://doi.org/10.1117/12.2675620