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Iodine-assisted ultrafast growth of high-quality monolayer MoS2with sulfur-terminated edges

Authors :
Wu, Qinke
Zhang, Jialiang
Tang, Lei
Khan, Usman
Nong, Huiyu
Zhao, Shilong
Sun, Yujie
Zheng, Rongxu
Zhang, Rongjie
Wang, Jingwei
Tan, Junyang
Yu, Qiangmin
He, Liqiong
Li, Shisheng
Zou, Xiaolong
Cheng, Hui-Ming
Liu, Bilu
Wu, Qinke
Zhang, Jialiang
Tang, Lei
Khan, Usman
Nong, Huiyu
Zhao, Shilong
Sun, Yujie
Zheng, Rongxu
Zhang, Rongjie
Wang, Jingwei
Tan, Junyang
Yu, Qiangmin
He, Liqiong
Li, Shisheng
Zou, Xiaolong
Cheng, Hui-Ming
Liu, Bilu
Source :
National Science Open; July 2023, Vol. 2 Issue: 4
Publication Year :
2023

Abstract

Two-dimensional (2D) semiconductors have attracted great attention to extend Moore’s law, which motivates the quest for fast growth of high-quality materials. However, taking MoS2as an example, current methods yield 2D MoS2with a low growth rate and poor quality with vacancy concentrations three to five orders of magnitude higher than silicon and other commercial semiconductors. Here, we develop a strategy of using an intermediate product of iodine as a transport agent to carry metal precursors efficiently for ultrafast growth of high-quality MoS2. The grown MoS2has the lowest density of sulfur vacancies (~1.41×1012cm−2) reported so far and excellent electrical properties with high on/off current ratios of 108and carrier mobility of 175 cm2V−1s−1. Theoretical calculations show that by incorporating iodine, the nucleation barrier of MoS2growth with sulfur-terminated edges reduces dramatically. The sufficient supply of precursor and low nucleation energy together boost the ultrafast growth of sub-millimeter MoS2domains within seconds. This work provides an effective method for the ultrafast growth of 2D semiconductors with high quality, which will promote their applications.

Details

Language :
English
ISSN :
20971168 and 20971400
Volume :
2
Issue :
4
Database :
Supplemental Index
Journal :
National Science Open
Publication Type :
Periodical
Accession number :
ejs63597495
Full Text :
https://doi.org/10.1360/nso/20230009