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Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments

Authors :
Yan, Aibin
Li, Zhixing
Cui, Jie
Huang, Zhengfeng
Ni, Tianming
Girard, Patrick
Wen, Xiaoqing
Source :
IEEE Transactions on Aerospace and Electronic Systems; 2023, Vol. 59 Issue: 3 p2885-2897, 13p
Publication Year :
2023

Abstract

This article proposes two quadruple node upset (QNU) recoverable latches, namely QNU-recoverable and high-impedance-state (HIS)-insensitive latch (QRHIL) and QRHIL-LC (low-cost version of the QRHIL), for highly robust computing in harsh radiation environments. First, the QRHIL that mainly consists of a 5×5 looped C-element matrix is proposed. Then, to reduce overhead, the QRHIL-LC that mainly uses 24 interlocking C-elements is proposed. Both latches can self-recover from any QNU, while the QRHIL-LC has a low cost compared to the QRHIL. Simulation waveforms show the QNU-recoverability of the proposed QRHIL and QRHIL-LC latches. Moreover, compared with the QRHIL latch, the QRHIL-LC can approximately save power dissipation by 16% and silicon area by 5%.

Details

Language :
English
ISSN :
00189251 and 15579603
Volume :
59
Issue :
3
Database :
Supplemental Index
Journal :
IEEE Transactions on Aerospace and Electronic Systems
Publication Type :
Periodical
Accession number :
ejs63271665
Full Text :
https://doi.org/10.1109/TAES.2022.3219372