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On background bias in deep metric learning

Authors :
Osten, Wolfgang
Nikolaev, Dmitry P.
Zhou, Jianhong (Jessica)
Kobs, Konstantin
Hotho, Andreas
Source :
Proceedings of SPIE; June 2023, Vol. 12701 Issue: 1 p1270114-1270114-8
Publication Year :
2023

Details

Language :
English
ISSN :
0277786X
Volume :
12701
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs63253254
Full Text :
https://doi.org/10.1117/12.2679270