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300mm in-line metrologies for the characterization of ultra-thin layer of 2D materials
- Source :
- Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p124961X-124961X-7, 1124657p
- Publication Year :
- 2023
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 12496
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Periodical
- Accession number :
- ejs63133496
- Full Text :
- https://doi.org/10.1117/12.2657968