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Photoelectron beam technology for SEM imaging with pixel-specific control of irradiation beam current

Authors :
Robinson, John C.
Sendelbach, Matthew J.
Nishitani, T.
Arakawa, Y.
Noda, S.
Koizumi, A.
Sato, D.
Shikano, H.
Iijima, H.
Honda, Y.
Amano, H.
Source :
Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p124962N-124962N-8, 1124667p
Publication Year :
2023

Details

Language :
English
ISSN :
0277786X
Volume :
12496
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs63133494
Full Text :
https://doi.org/10.1117/12.2657853