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Computational lithography solutions to support EUV high-NA patterning

Authors :
Kim, Ryoung-Han
Lafferty, Neal V.
Zhao, Rongkuo
Zhou, Fan
Tang, Jialei
Lu, Jeff
Liu, Yunbo
Sun, Dezheng
Tien, Ming-Chun
Hsu, Stephen
Gupta, Rachit
Zhang, Youping
Zimmermann, Joerg
Source :
Proceedings of SPIE; April 2023, Vol. 12495 Issue: 1 p124950R-124950R-12, 12370063p
Publication Year :
2023

Details

Language :
English
ISSN :
0277786X
Volume :
12495
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs63125975
Full Text :
https://doi.org/10.1117/12.2660858