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EUV pellicle scanner integration for N2 nodes and beyond

Authors :
Lio, Anna
Burkhardt, Martin
van de Kerkhof, Mark
Klein, Alexander
Seoane, Beatriz
Vermeulen, Paul
Gallagher, Emily
Timmermans, Marina Y.
Pollentier, Ivan
Bekaert, Joost
Source :
Proceedings of SPIE; April 2023, Vol. 12494 Issue: 1 p124940D-124940D-9, 1124470p
Publication Year :
2023

Details

Language :
English
ISSN :
0277786X
Volume :
12494
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs63125911
Full Text :
https://doi.org/10.1117/12.2658353