Back to Search Start Over

End-to-end sensor system modeling and validation for AR/VR/MR applications

Authors :
Witzigmann, Bernd
Osiński, Marek
Arakawa, Yasuhiko
Kramer, Evan L.
Chao, Qing
Schaub, Michael
Chen, Song
Gao, Wei
Source :
Proceedings of SPIE; March 2023, Vol. 12415 Issue: 1 p124150S-124150S-12, 12290863p
Publication Year :
2023

Details

Language :
English
ISSN :
0277786X
Volume :
12415
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs62889736
Full Text :
https://doi.org/10.1117/12.2668460