Back to Search
Start Over
Room-Temperature Direct Cu Semi-Additive Plating (SAP) Bonding for Chip-on-Wafer 3D Heterogenous Integration With μLED
- Source :
- IEEE Electron Device Letters; 2023, Vol. 44 Issue: 3 p500-503, 4p
- Publication Year :
- 2023
-
Abstract
- This letter describes a direct Cu bonding technology to there-dimensionally integrate heterogeneous dielets based on a chip-on-wafer configuration. 100-<inline-formula> <tex-math notation="LaTeX">$\mu \text{m}$ </tex-math></inline-formula>-cubed blue <inline-formula> <tex-math notation="LaTeX">$\mu $ </tex-math></inline-formula>LEDs temporarily adhered on a photosensitive resin are interconnected by semi-additive plating (SAP) without thermal compression bonding. By using SAP bonding, a lot of dielets can be stacked on thin 3D-IC chiplets. The following three key technologies are applied to solve the yield issues of SAP bonding. After pick-and-place assembly, additional coplanarity enhancement eliminates Cu bridges grown to a small gap between the <inline-formula> <tex-math notation="LaTeX">$\mu $ </tex-math></inline-formula>LEDs and photosensitive resin. The <inline-formula> <tex-math notation="LaTeX">$\mu $ </tex-math></inline-formula>LEDs arrays with sidewalls insulated by room-temperature ozone-ethylene-radical (OER)-SiO2-CVD are successfully bonded on sapphire wafers and a thin 3D-IC with through-Si via (TSV). Further design optimization is required, but partial seed pre-etching works well to increase the yield. Fully integrated module implementation with the 3D-ICs will be the next stage, however, we discuss a superior prospect for yield enhancement toward nearly 100%.
Details
- Language :
- English
- ISSN :
- 07413106 and 15580563
- Volume :
- 44
- Issue :
- 3
- Database :
- Supplemental Index
- Journal :
- IEEE Electron Device Letters
- Publication Type :
- Periodical
- Accession number :
- ejs62395254
- Full Text :
- https://doi.org/10.1109/LED.2023.3237834