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UV Photonic-Integrated-Circuits-Based Structured Illumination Microscopy With a Field of View Larger than <inline-formula><tex-math notation="LaTeX">$100\,\mu \text{m}^{2}$</tex-math></inline-formula>
- Source :
- IEEE Journal on Selected Topics in Quantum Electronics; 2023, Vol. 29 Issue: 4 p1-9, 9p
- Publication Year :
- 2023
-
Abstract
- Photonic integrated circuits (PICs) are expected to add practicality and new functionalities in a considerable number of optical applications, including optical microscopy. Here, we present a PIC design allowing a far-field structured UV illumination pattern with a fringe period as low as <inline-formula><tex-math notation="LaTeX">$\text{370}\,\text{nm}$</tex-math></inline-formula>, a fringe visibility of 0.83 over field of views of more than <inline-formula><tex-math notation="LaTeX">$150\,\mu \text{m}\,\times 200\,\mu \text{m}$</tex-math></inline-formula> and a radiant intensity as large as <inline-formula><tex-math notation="LaTeX">$\text{0.49}\,\text{mW}$</tex-math></inline-formula>. The circuits include single mode waveguides with propagation losses of <inline-formula><tex-math notation="LaTeX">$\text{3}\,\text{dB/cm}$</tex-math></inline-formula> at a wavelength <inline-formula><tex-math notation="LaTeX">$\lambda =360\,\text{nm}$</tex-math></inline-formula>, two diffraction gratings for beam shaping out of the chip plane, a beam splitter and a phase shifter. Using fluorescent gratings with pitches longer or shorter than the wavelength, as control objects, and a collecting lens with a numerical aperture of 0.5, the current PICs enable to highlight experimentally the Moiré pattern at the heart of the optical resolution enhancement and to achieve a doubling of the optical resolution in the direction of the illumination.
Details
- Language :
- English
- ISSN :
- 1077260X and 15584542
- Volume :
- 29
- Issue :
- 4
- Database :
- Supplemental Index
- Journal :
- IEEE Journal on Selected Topics in Quantum Electronics
- Publication Type :
- Periodical
- Accession number :
- ejs62393176
- Full Text :
- https://doi.org/10.1109/JSTQE.2023.3243776