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Study on Al-Ge Bonding and Quality Improvement in CMEMS Process

Authors :
Gu, Athics
Lin, Paul-Chang
Chang, Vincent
Li, Terry
Zhang, Ji-Wei
Jiang, Jian-Yong
Xing, Charles
Source :
ECS Transactions; March 2012, Vol. 44 Issue: 1
Publication Year :
2012

Abstract

CMEMS(CMOS and Micro Electro Mechanical Systems) process is integration of CMEMS and cap wafer, which is realized through bonding process and has been more and more important in IC industry currently. The bonding process is kernel in CMEMS manufacture and is impacted by material, pressure, temperature and so on. In standard bonding process, Al-Ge bonding which is selected for the good adhesion comparing with other bonding material. In this paper, the bonding process conditions are designed according to the structure of CMEMS and characteristics of Al-Ge material, and experiments including leakage rate and bonding strength are implemented to discuss the bonding quality. In the end, suitable bonding process and its summary of side effect for Al-Ge are put forward.

Details

Language :
English
ISSN :
19385862 and 19386737
Volume :
44
Issue :
1
Database :
Supplemental Index
Journal :
ECS Transactions
Publication Type :
Periodical
Accession number :
ejs61786820
Full Text :
https://doi.org/10.1149/1.3694477