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The measurement of the refractive index n and k value of the EUV resist which used EUV reflectivity measurement method

Authors :
Itani, Toshiro
Naulleau, Patrick P.
Gargini, Paolo A.
Ronse, Kurt G.
Sekiguchi, A.
Ohta, Y.
Harada, T.
Watanabe, T.
Source :
Proceedings of SPIE; December 2022, Vol. 12292 Issue: 1 p122920U-122920U-9, 1106290p
Publication Year :
2022

Details

Language :
English
ISSN :
0277786X
Volume :
12292
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs61446137
Full Text :
https://doi.org/10.1117/12.2644821