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Impedance Corrected De-Embedding

Authors :
Ellison, Jason J.
Agili, Sedig S.
Source :
IEEE Electromagnetic Compatibility Magazine; 2022, Vol. 11 Issue: 3 p45-48, 4p
Publication Year :
2022

Abstract

The 2x-thru, the most common standard used for creating fixture models, is never identical to the Fixture-DUT-Fixture due to printed circuit board (PCB) process variation. This difference leads to de-embedding error in the frequency and time domain. This paper introduces a method of impedance corrected de-embedding and its associated advantages. Impedance corrected de-embedding removes the error from differences between the Fixture-DUT-Fixture and reference 2x-thru impedance by implementing a peeling process. Further, the method is inherently more robust, because the fixture manufacturing tolerances do not impact the de-embedding results.

Details

Language :
English
ISSN :
21622264 and 21622272
Volume :
11
Issue :
3
Database :
Supplemental Index
Journal :
IEEE Electromagnetic Compatibility Magazine
Publication Type :
Periodical
Accession number :
ejs61412086
Full Text :
https://doi.org/10.1109/MEMC.2022.9982534