Back to Search Start Over

Automatic detection of tomato leaf contamination portion using deep neural network

Authors :
Sirikonda, Shwetha
Kumar, S. Naresh
Chandana, G.
Nikhitha, M.
Hima Sree, S.
Mahender, K.
Source :
AIP Conference Proceedings Online; May 2022, Vol. 2418 Issue: 1 p020054-20062, 9p
Publication Year :
2022

Details

Language :
English
ISSN :
0094243X and 15517616
Volume :
2418
Issue :
1
Database :
Supplemental Index
Journal :
AIP Conference Proceedings Online
Publication Type :
Periodical
Accession number :
ejs59743497
Full Text :
https://doi.org/10.1063/5.0081765