X-ray stress measurement of SiC single-crystal induced by laser ablation

MLA

Su, Junhong, et al. “X-Ray Stress Measurement of SiC Single-Crystal Induced by Laser Ablation.” Proceedings of SPIE, vol. 12169, no. 1, Mar. 2022, p. 12169A2-12169A2-6. EBSCOhost, https://doi.org/10.1117/12.2625806.

APA

Su, J., Chen, L., Chu, J., Zhu, S., Yu, Q., Deng, Y., Zhou, Y., & Zhang, Y. (2022). X-ray stress measurement of SiC single-crystal induced by laser ablation. Proceedings of SPIE, 12169(1), 12169A2-12169A2-6. https://doi.org/10.1117/12.2625806

Chicago

Su, Junhong, Lianghui Chen, Junhao Chu, Shining Zhu, Qifeng Yu, Ya Deng, Yufeng Zhou, and Yumin Zhang. 2022. “X-Ray Stress Measurement of SiC Single-Crystal Induced by Laser Ablation.” Proceedings of SPIE 12169 (1): 12169A2-12169A2-6. doi:10.1117/12.2625806.