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High-resolution 4H-SiC Schottky barrier radiation detectors on 250 μm epitaxial layers for harsh environment applications

Authors :
Cherepy, Nerine J.
Fiederle, Michael
James, Ralph B.
Kleppinger, Joshua W.
Karadavut, Omerfaruk
Nag, Ritwik
Chaudhuri, Sandeep K.
Mandal, Krishna C.
Source :
Proceedings of SPIE; September 2021, Vol. 11838 Issue: 1 p1183816-1183816-11
Publication Year :
2021

Details

Language :
English
ISSN :
0277786X
Volume :
11838
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs58063466
Full Text :
https://doi.org/10.1117/12.2596470