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Lifetime and Spin Relaxation Time Measurements of Micro-Fabricated GaAs Tips

Authors :
Ryoichi Shinohara, Ryoichi Shinohara
Koichi Yamaguchi, Koichi Yamaguchi
Hidenobu Hirota, Hidenobu Hirota
Yoshishige Suzuki, Yoshishige Suzuki
Takashi Manago, Takashi Manago
Hiroyuki Akinaga, Hiroyuki Akinaga
Takashi Kuroda, Takashi Kuroda
Fujio Minami, Fujio Minami
Source :
Japanese Journal of Applied Physics; December 2000, Vol. 39 Issue: 12 p7093-7093, 1p
Publication Year :
2000

Abstract

The lifetime and the spin relaxation time of excited electrons in GaAs microtips tailored for scanning tunneling microscope (STM) with spin polarization detection were measured by time-resolved polarized photoluminescence at room temperature. The electron lifetime obtained from the tip-fabricated p-type GaAs substrate was about 20 ps shorter than that obtained from the GaAs substrate without microtips. This is attributed to the enhanced surface recombination in the microtip. The spin relaxation time was comparable to the electron lifetime for the tip-fabricated GaAs substrate. From electron lifetime and spin relaxation time, a respectable spin polarization of about 20% was evaluated in the tip-fabricated GaAs substrate, which was about 1.2 times larger than that in the GaAs substrate without microtips, under the 0° incident angle of the excitation light. The influence of oblique incidence of the excitation light is also discussed.

Details

Language :
English
ISSN :
00214922 and 13474065
Volume :
39
Issue :
12
Database :
Supplemental Index
Journal :
Japanese Journal of Applied Physics
Publication Type :
Periodical
Accession number :
ejs56137758
Full Text :
https://doi.org/10.1143/JJAP.39.7093