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Effects of Deuterium on Low-Temperature Si Epitaxy by Photo-Chemical Vapor Deposition
- Source :
- Japanese Journal of Applied Physics; May 1991, Vol. 30 Issue: 5 p893-893, 1p
- Publication Year :
- 1991
-
Abstract
- Epitaxial Si films have been successfully grown by the photochemical vapor deposition process using the mixture of SiH4, SiH2F2and D2gases at temperatures from 200 to 475°C. Using H2as diluting gas, the epitaxial Si films were obtained at temperatures from 200 to 350°C. However, the upper limit of the growth temperature was raised about 100°C (from 350 to 475°C) by substituting D2for H2as the diluting gas. Surface morphology and crystallinity were also improved with D2. Furthermore, we carried out heavy phosphorous doping with D2and obtained a film with an electron concentration of 1×1021cm-3.
Details
- Language :
- English
- ISSN :
- 00214922 and 13474065
- Volume :
- 30
- Issue :
- 5
- Database :
- Supplemental Index
- Journal :
- Japanese Journal of Applied Physics
- Publication Type :
- Periodical
- Accession number :
- ejs56121288
- Full Text :
- https://doi.org/10.1143/JJAP.30.893