Back to Search Start Over

(Invited) Wafer Bonding for the Manufacture of High-Brightness and High-Efficiency Light-Emitting Diodes

Authors :
Plossl, Andreas E.
Baur, Johannes
Eissler, Dieter
Engl, Karl
Harle, Volker
Hahn, Berthold
Heindl, Alexander
Illek, Stefan
Klemp, Christoph
Rode, Patrick
Streubel, Klaus
Tangrin, Ivar
Source :
ECS Transactions; October 2010, Vol. 33 Issue: 4 p613-624, 12p
Publication Year :
2010

Abstract

Wafer bonding based layer transfer approaches permit the fabrication of powerful volume or surface-emitting light-emitting diodes (LEDs). Here we briefly review the basic approaches taken and show some exemplary results of our metal-bonded UX:3-LEDs with buried mirror and buried metallic current distribution for both polarities, . The overall device performance benefits from the UX:3 variant of our ThinGaN technology: (i) at a drive current of 350 mA, a 5 % brightness increase for blue and green emission; through improved interaction of chip and phosphor coating, a 10-20% brightness increase for white LEDs; (iii) when trebling the current from 350 mA to 1 A, the sublinear brightness increase, called droop, is reduced to only 15%; (iv) at a 1 A drive current, a drop in forward voltage of only 200 mV occurs.

Details

Language :
English
ISSN :
19385862 and 19386737
Volume :
33
Issue :
4
Database :
Supplemental Index
Journal :
ECS Transactions
Publication Type :
Periodical
Accession number :
ejs52649133