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Mid-Infrared Sensing Using Heavily Doped Germanium Plasmonics on Silicon Substrates
- Source :
- ECS Transactions; August 2016, Vol. 75 Issue: 8 p247-251, 5p
- Publication Year :
- 2016
-
Abstract
- Heavily-doped semiconductor films are very promising for applications in mid-infrared plasmonic devices because the real part of their dielectric function is negative and broadly tunable in this wavelength range. In this work, we investigate, n-type doped Ge epilayers grown on Si substrates. We design and realize Ge nano-antennas on Si substrates demonstrating the presence of localized plasmon resonances, and exploit them for molecular sensing in the mid-infrared.
Details
- Language :
- English
- ISSN :
- 19385862 and 19386737
- Volume :
- 75
- Issue :
- 8
- Database :
- Supplemental Index
- Journal :
- ECS Transactions
- Publication Type :
- Periodical
- Accession number :
- ejs52641924