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(Invited) Resistive RAM Memories from a Material Perspective: Exploration of the Switching for Several Oxides Using Ab Initio Simulations

Authors :
Blaise, Philippe
Sklenard, Benoit
Traore, Boubacar
Nail, Cecile
Vianello, Elisa
Molas, Gabriel
Source :
ECS Transactions; January 2017, Vol. 75 Issue: 32 p25-28, 4p
Publication Year :
2017

Abstract

The development of Resistive RAM (RRAM) devices requires a challenging selection process of materials in order to exceed the current FLASH memory technology. We review here some RRAM materials options thanks to ab initio simulations. Based on materials science and thermodynamics, calculations done in DFT (density functional theory), carefully suited to experimental context, are able to explain the essential mechanisms at the heart of RRAM devices operations like the Forming and SET/RESET steps.

Details

Language :
English
ISSN :
19385862 and 19386737
Volume :
75
Issue :
32
Database :
Supplemental Index
Journal :
ECS Transactions
Publication Type :
Periodical
Accession number :
ejs52641224