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VERT-X: VERTical X-ray raster-scan facility for ATHENA calibration. The concept design.
- Source :
- Proceedings of SPIE; September 2019, Vol. 11119 Issue: 1 p111190O-111190O-13, 11007824p
- Publication Year :
- 2019
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 11119
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Periodical
- Accession number :
- ejs51687676
- Full Text :
- https://doi.org/10.1117/12.2530713