Back to Search Start Over

X-ray testing of silicon pore optics

X-ray testing of silicon pore optics

Details

Language :
English
ISSN :
0277786X
Volume :
11119
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs51687670
Full Text :
https://doi.org/10.1117/12.2530977