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Design and development of soft x-ray diagnostics based on GEM detectors at IPPLM
- Source :
- Proceedings of SPIE; November 2019, Vol. 11176 Issue: 1 p111764F-111764F-12, 11064649p
- Publication Year :
- 2019
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 11176
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Periodical
- Accession number :
- ejs51553662
- Full Text :
- https://doi.org/10.1117/12.2537832