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Sensing Sub-10 nm Wide Perturbations in Background Nanopatterns Using Optical Pseudoelectrodynamics Microscopy (OPEM)
- Source :
- Nano Letters; August 2019, Vol. 19 Issue: 8 p5347-5355, 9p
- Publication Year :
- 2019
-
Abstract
- Using light as a probe to investigate perturbations with deep subwavelength dimensions in large-scale wafers is challenging because of the diffraction limit and the weak Rayleigh scattering. In this Letter, we report on a nondestructive noninterference far-field imaging method, which is built upon electrodynamic principles (mechanical work and force) of the light-matter interaction, rather than the intrinsic properties of light. We demonstrate sensing of nanoscale perturbations with sub-10 nm features in semiconductor nanopatterns. This framework is implemented using a visible-light bright-field microscope with a broadband source and a through-focus scanning apparatus. This work creates a new paradigm for exploring light-matter interactions at the nanoscale using microscopy that can potentially be extended to many other problems, for example, bioimaging, material analysis, and nanometrology.
Details
- Language :
- English
- ISSN :
- 15306984 and 15306992
- Volume :
- 19
- Issue :
- 8
- Database :
- Supplemental Index
- Journal :
- Nano Letters
- Publication Type :
- Periodical
- Accession number :
- ejs50512368
- Full Text :
- https://doi.org/10.1021/acs.nanolett.9b01806