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Accelerator-based compact extreme ultraviolet (EUV) sources for lithography

Authors :
Ronse, Kurt G.
Hendrickx, Eric
Naulleau, Patrick P.
Gargini, Paolo A.
Itani, Toshiro
Wu, Juhao
Chao, Alexander W.
Source :
Proceedings of SPIE; October 2018, Vol. 10809 Issue: 1 p1080907-1080907-6
Publication Year :
2018

Details

Language :
English
ISSN :
0277786X
Volume :
10809
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs47284541
Full Text :
https://doi.org/10.1117/12.2501900